Difference between revisions of "Insuk Chong"

From WikiBiron
(I think you should have removed brackets)
(In Suk Chong)
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      E-mail:ichong@usc.edu
 
      E-mail:ichong@usc.edu
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[[Image:http://biron.usc.edu/~ichong/IMG_3985.jpg insuk.jpg]]
  
 
== Objective ==
 
== Objective ==

Revision as of 09:08, 12 July 2005

In Suk Chong

Ph.D. student

Department of Electrical Engineering- Systems

University of Southern California

Los Angeles, CA

Telephone: (213)-740-4655

E-mail:ichong@usc.edu

File:Http://biron.usc.edu/~ichong/IMG 3985.jpg insuk.jpg

Objective

Fault tolerant compression related to multimedia compression

Video and Image Coding and Compression


Education

  • Sep. 2004-present: University of Southern California, Los Angeles, CA

Ph.D. student, Department of Electrical Engineering-Systems

  • Sep. 2002-May. 2004: University of Southern California, Los Angeles, CA

Master of Science, May 2004, Department of Electrical Engineering-Systems

  • Mar. 1995-Aug. 1998: Seoul National University, Republic of Korea

Bachelor of Science in Engineering, Cum Laude, Aug. 1998, School of Electrical Engineering


Research Field

  • Video/Image compression, processing, and communication
  • Fault tolerant compression related to multimedia compression system architecture


Research Experience

  • Sep. 2004-present Research Assistant
    • Institute: Signal and Image Processing Institute, University of Southern California, Los Angeles, CA
    • Topics of research: Fault resilient compression related to multimedia compression system


Technical Experience

  • July 1998 – September 2001 Researcher and Software & Hardware Developer
    • Employer: Fine Digital co. Ltd
    • Developed Products:
      • NMS (Network Management System)
      • Digital Optic Repeater for celluar system (IS-95, CDMA2000)
      • ADSL-Access Point for IEEE 802.11g (Wireless LAN)


Publications

  • I. S. Chong and A. Ortega., Hardware Testing For Error Tolerant Multimedia Compression based on Linear Transforms., In Proc. of IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT’05. Accepted.

ETC

For detailed resume click [1]